|
1
|
|
|
|
TA418.52
.S8
|
Structure & properties of materials
|
New York, [ United States ] : John Wiley and Sons , 1965
|
Hayden, Wayne
|
|
16053
|
|
2
|
|
|
|
TA410
.W6
|
Image analysis : applications in materials engineering
|
Boca Raton, Florida, [ United States ] : CRC Press , 1999
|
Wojnar, Leszek
|
|
42411
|